Automatic generation and compaction of March tests for memory arrays
نویسندگان
چکیده
Given a set of memory array faults the problem of computing a compact March test that detects all specified memory array faults is addressed. In this paper, we propose a novel approach in which every memory array fault is modeled by a set of primitive memory faults. A primitive March test is defined for each primitive memory fault. We show that March tests that detect the specified memory array faults are composed of primitive March tests. A method to compact the March tests for the specified memory array faults is described. A set of examples to illustrate the approach is presented. Experimental results demonstrate the productivity gained using the proposed framework.
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عنوان ژورنال:
- IEEE Trans. VLSI Syst.
دوره 9 شماره
صفحات -
تاریخ انتشار 2001